The integrating of the inverted microscope objective into the central base becouse of high mechanical rigidity provides stability of the system making quality images and long-term experiments possible. Inverted optical microscope stability is not so important any more.
Scanning Probe Microscopy |
SPM methods |
in air & liquid |
AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Adhesion Force Imaging/ Force Modulation/ Phase Imaging/ AFM Lithography (scratching)/ Force- Distance curves |
in air only |
STM/ Magnetic Force Microscopy/ Electrostatic Force Microscopy / Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Current), STM |
|
Scanning by sample |
Scanning by probe* |
Sample size |
in air |
40 mm in diameter,
15 mm in height |
100 mm in diameter,
15 mm in height |
in liquid |
Up to 14x14x2.5 mm |
Up to 15x15x3 mm |
XY sample positioning range |
in air |
5x5 mm, readable resolution -5 um
sensitivity -2 um |
in liquid |
1x1 mm, readable resolution -5 um
sensitivity-2 um |
Scan range |
100x100x10 um, 3x3x2.6 um
100x100x10 um, 50x50x5 um |
Up to 200x200x20 um** (DualScan™ mode) |
Non-linearity, XY
(with closed-loop sensors***) |
< 0.1% |
< 0.15% |
Noise level, Z
(RMS in bandwidth 1000 Hz) |
With sensors |
0.04 nm (typically),
≤ 0.06 nm |
0.06 nm (typically),
≤ 0.07 nm |
Without sensors |
0.03 nm |
0.05 nm |
Noise level, XY***
(RMS in bandwidth 200 Hz) |
With sensors |
0.2 nm (typically),
≤ 0.3 nm (XY 100 um) |
0.1 nm (typically),
≤ 0.2 nm (XY 50 um) |
Without sensors |
0.02 nm (XY 100 um)
0.001 nm (XY 3 um) |
0.01 nm (XY 50 um) |
Temperature control
(For operation in fluid environment) |
Range |
- |
from RT to 60°C |
Stability |
- |
≤ ±0.01°C |
*Scanning head can be configured to serve as a stand-alone device for specimens of unlimited sizes.
** 200 m scan range is possible with the unique DualScan™ mode when scanning by sample and scanning by probe can be done simultaneously.
*** Built-in capacitive sensors have extremely low noise and any area down to 50x50 nm can be scanned with closed-loop control.