Scanning Probe Microscopy

in-situ: AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy / Phase Imaging/Force Modulation/ Adhesion Force Imaging/ Magnetic Force Microscopy/ Electrostatic Force Microscopy / Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/ Lithography: AFM (Force and Current)

Sample size

Up to 8 mm in diameter,
up to 15 mm in height

Sample weight

Up to 10 g

Scan range

50x50x5 um

Positioning resolution

Readable resolution -5 um
Sensitivity-2 um

Non-linearity, XY

< 0.15%

Noise level, Z
(RMS in bandwidth 1000 Hz)

0.06 nm (typically), ≤ 0.07 nm

Noise level, XY
(RMS in bandwidth 200 Hz)

0.1 nm (typically), ≤ 0.2 nm

Vibration isolation

Dynamic

Frequency range 0.7 – 1000 Hz

Passive

For frequencies above 1 kHz

Ultratomy

Self locking

Yes

Graduation

±30° graduation

Clearance angle adjustment

-2° to 15° with 1°scale

Knife holder

For 6-12 mm knives

Coarse knifemovements

N-S

10 mm stepping motor

E-W

25 mm stepping motor

Cutting window

0.2-15 mm adjustable

Cutting speed

0.05-100 mm/s wheel contr.

Section thickness

0-15000 nm wheel contr.

FEED / SPEED storage

5

Return speeds

10, 30, 50 mm/s

Step control

0.1-15 m steps

Section counter

Yes

Feed totalizer

Yes

Count down

Yes

Rocking mode

Yes

E-W measurement

Yes

Auto trim

Yes

Specimen advance indicator

Yes

Working distance

110 mm

Universal specimen holder

2pcs.

Flat specimen holder

1p.

Instrument table

Dimensions

Shock-absorbing elements