Scanning Near-Field Microscopy

Shear Force Microscopy / SNOM reflection, transmission, luminescence (optional)/ any AFM modes are available optionally

Specification

Laser module

Wavelength*

441, 488, 514, 532, 633 nm

Coupling unit

X-Y-Z positioner, positioning accuracy 1 um

V-groove fiber holder

Coupling 40X objective

Shear Force Imaging

Sample size

Up to 100 mm in diameter,
up to 15 mm in height

XY sample positioning range

5x5 mm

Sample positioning accuracy

Readable resolution-5 um
Sensitivity-2 um

Closed-loop operation

Capacitive sensors for 3 axes

Scan range

Scanning by sample

100x100x25 um

Scanning by probe

100x100x7 um

Non-linearity, XY

Scanning by sample

0.03 % (typically)

Scanning by probe

< 0.15 %

Noise level, Z

Scanning by sample

< 0.2 nm (typically)

Scanning by probe

0.04 nm (typically), ≤ 0.06 nm

Noise level, XY

Scanning by sample

< 0.5 nm (typically)

Scanning by probe

0.2 nm (typically), ≤ 0.3 nm

Quartz tuning fork base frequency

190 kHz

Optical fiber diameter

90 um (for 480-550 nm), 125 um (for 600-680 nm)

Aperture diameter

< 100 nm

Channels for simultaneous registration

Reflection

Transmission/Fluorescence

PMT detectors (for each channel)

Spectral response

185-850 nm

Sensitivity at 420 nm

3x1010 V/W

Current-voltage conversion amplifier (built-in)

1x106V/A

Frequency band width

20kHz

High voltage power supply

Built-in

Vibration isolation

Active

0.7-1000 Hz

Passive

Above 1 kHz