Scanning Probe Microscope Nano Educator

Scientific training laboratory of nanotechnology for institutes and universities

Complex approach to educational process

  • Students oriented
    - User friendly interface
    - SPM techniques step-by-step mastering
    - Clearness, animated support
    - No complicated adjustments
    - Inexpensive consumed materials
    - Simple probe replacement
    - Probe recovery availability

Basic operation modes

  • AFM
    - Semicontact modes
    - Topography imaging (constant force mode)
    - Phase imaging
    - Force imaging (constant height mode)
    - Force spectroscopy
    - Operation in liquids
  • AFM lithography
    - Dynamic plowing lithography (force)
  • STM
    - Topography imaging (constant current mode)
    - Differential contrast (modulation in X-Y plane)
    - Current imaging (constant height mode)
    - Work function measurements (Z modulation)
    - Tunnel spectroscopy (dI/dV measurements)
    - Operation in dielectric liquids

Parameter

Sample size

diameter up to 12 mm

Sample thickness

up to 3 mm

Scan range

70x70x10 m (+/-10%)

Scanner nonlinearity

2%

Min. scanning step

1 Å

Max. scan points

1024x1024 (max. RAM 64 MB)

Resolution

AFM mode

X_Y – 10 nm, Z – 3 nm

STM mode

X_Y – 10 nm, Z – 2 nm

Probe characteristics

Material

Tungsten wire D 100 – 150 m

Tip curvature radius

100 nm

Tip cone angle

20 – 40°

Tip sharpening availability

up to 10 nm

Optical system

CCD camera for visual tip approach control

Scanning

by sample

Probe is grounded

Compatibility with long focus optical microscope

Seek Inter Corporation Limited.
53/69 Sukhumvit 103 Nongbon Praves Bangkok 10260 Thailand
Tel. (662)7472155 Fax (662) 7473155
E-mail : sales@seekscope.com
Website : http://www.seekscope.com